Applications/ScratchAssayAnalyzer: Difference between revisions
Line 6: | Line 6: | ||
'''Description:'''<br/> | '''Description:'''<br/> | ||
* Quantifies the scratch area in monolayer cell culture images with levelset techniques | * Quantifies the scratch area in monolayer cell culture images with levelset techniques | ||
* Tries to detect already closed scratches via classification utilizing (user trainable) support vector machines (SVM) | |||
* Applicable to brightfield and fluorescence images | * Applicable to brightfield and fluorescence images | ||
* Combines the results from images of different time points in a results table | * Combines the results from images of different time points in a results table | ||
Line 16: | Line 17: | ||
(since MiToBo version 0.9.5) | (since MiToBo version 0.9.5) | ||
'''Published in:'''<br/> | |||
''M. Glaß, B. Möller, A. Zirkel, K. Wächter, S. Hüttelmaier and S. Posch,<br/> | ''M. Glaß, B. Möller, A. Zirkel, K. Wächter, S. Hüttelmaier and S. Posch,<br/> | ||
'''"Cell migration analysis: Segmenting scratch assay images with level sets and support vector machines"'''.<br/> | '''"Cell migration analysis: Segmenting scratch assay images with level sets and support vector machines"'''.<br/> |
Revision as of 13:56, 11 August 2014
Scratch Assay Analyzer
Description:
- Quantifies the scratch area in monolayer cell culture images with levelset techniques
- Tries to detect already closed scratches via classification utilizing (user trainable) support vector machines (SVM)
- Applicable to brightfield and fluorescence images
- Combines the results from images of different time points in a results table
Name of Plugin/Operator:
de.unihalle.informatik.MiToBo.apps.scratchAssay.ScratchAssayAnalyzer
(since MiToBo version 0.9.5)
Published in:
M. Glaß, B. Möller, A. Zirkel, K. Wächter, S. Hüttelmaier and S. Posch,
"Cell migration analysis: Segmenting scratch assay images with level sets and support vector machines".
Pattern Recognition, Volume 45, Issue 9, pp. 3154-3165, September 2012.
M. Glaß, B. Möller, A. Zirkel, K. Wächter, S. Hüttelmaier and S. Posch,
"Scratch Assay Analysis with Topology-preserving Level Sets and Texture Measures".
Proc. of Iberian Conference on Pattern Recognition and Image Analysis (IbPRIA '11), LNCS 6669, pp. 100-108, Springer, Las Palmas de Gran Canaria, Spain, June 2011.
Example images
Scratch assay images