Applications/ScratchAssayAnalyzer: Difference between revisions

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'''Description:'''<br/>
'''Description:'''<br/>
* Quantifies the scratch area in monolayer cell culture images with levelset techniques
* Quantifies the scratch area in monolayer cell culture images with levelset techniques
* Tries to detect already closed scratches via classification utilizing (user trainable) support vector machines (SVM)
* Applicable to brightfield and fluorescence images
* Applicable to brightfield and fluorescence images
* Combines the results from images of different time points in a results table
* Combines the results from images of different time points in a results table
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(since MiToBo version 0.9.5)
(since MiToBo version 0.9.5)


published in<br/>
'''Published in:'''<br/>
''M. Glaß, B. Möller, A. Zirkel, K. Wächter, S. Hüttelmaier and S. Posch,<br/>
''M. Glaß, B. Möller, A. Zirkel, K. Wächter, S. Hüttelmaier and S. Posch,<br/>
'''"Cell migration analysis: Segmenting scratch assay images with level sets and support vector machines"'''.<br/>
'''"Cell migration analysis: Segmenting scratch assay images with level sets and support vector machines"'''.<br/>

Revision as of 13:56, 11 August 2014

Scratch Assay Analyzer

BF U2OS overlay.png
GFP U2OS overlay.png


Description:

  • Quantifies the scratch area in monolayer cell culture images with levelset techniques
  • Tries to detect already closed scratches via classification utilizing (user trainable) support vector machines (SVM)
  • Applicable to brightfield and fluorescence images
  • Combines the results from images of different time points in a results table

Name of Plugin/Operator:
de.unihalle.informatik.MiToBo.apps.scratchAssay.ScratchAssayAnalyzer
(since MiToBo version 0.9.5)

Published in:
M. Glaß, B. Möller, A. Zirkel, K. Wächter, S. Hüttelmaier and S. Posch,
"Cell migration analysis: Segmenting scratch assay images with level sets and support vector machines".
Pattern Recognition, Volume 45, Issue 9, pp. 3154-3165, September 2012.

M. Glaß, B. Möller, A. Zirkel, K. Wächter, S. Hüttelmaier and S. Posch,
"Scratch Assay Analysis with Topology-preserving Level Sets and Texture Measures".
Proc. of Iberian Conference on Pattern Recognition and Image Analysis (IbPRIA '11), LNCS 6669, pp. 100-108, Springer, Las Palmas de Gran Canaria, Spain, June 2011.


Example images
Scratch assay images